Lifetimes of Confined Acoustic Phonons in ...
Document type :
Compte-rendu et recension critique d'ouvrage
Title :
Lifetimes of Confined Acoustic Phonons in Ultra-Thin Silicon Membranes
Author(s) :
Cuffe, John [Auteur]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Chávez, Emigdio [Auteur]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Chapuis, Pierre-Olivier [Auteur]
Centre d'Energétique et de Thermique de Lyon [CETHIL]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Alzina, Francesc [Auteur]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Ristow, Oliver [Auteur]
Universität Konstanz
Shchepetov, Andrey [Auteur]
VTT Technical Research Centre of Finland [VTT]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Hettich, Mike [Auteur]
Universität Konstanz
Dekorsy, Thomas [Auteur]
Universität Konstanz
Torres, Clivia M. Sotomayor [Auteur]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Prunnila, Mika [Auteur]
VTT Technical Research Centre of Finland [VTT]
Ahopelto, Jouni [Auteur]
VTT Technical Research Centre of Finland [VTT]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Chávez, Emigdio [Auteur]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Chapuis, Pierre-Olivier [Auteur]
Centre d'Energétique et de Thermique de Lyon [CETHIL]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Alzina, Francesc [Auteur]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Ristow, Oliver [Auteur]
Universität Konstanz
Shchepetov, Andrey [Auteur]
VTT Technical Research Centre of Finland [VTT]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Hettich, Mike [Auteur]
Universität Konstanz
Dekorsy, Thomas [Auteur]
Universität Konstanz
Torres, Clivia M. Sotomayor [Auteur]
ICN2 - Institut Catala de Nanociencia i Nanotecnologia [ICN2]
Prunnila, Mika [Auteur]
VTT Technical Research Centre of Finland [VTT]
Ahopelto, Jouni [Auteur]
VTT Technical Research Centre of Finland [VTT]
Journal title :
Physical Review Letters
Pages :
095503
Publisher :
American Physical Society
Publication date :
2013
ISSN :
0031-9007
HAL domain(s) :
Physique [physics]/Matière Condensée [cond-mat]/Autre [cond-mat.other]
Physique [physics]/Mécanique [physics]/Acoustique [physics.class-ph]
Physique [physics]/Mécanique [physics]/Acoustique [physics.class-ph]
English abstract : [en]
We study the relaxation of coherent acoustic phonon modes with frequencies up to 500 GHz in ultra-thin free-standing silicon membranes. Using an ultrafast pump-probe technique of asynchronous optical sampling, we observe ...
Show more >We study the relaxation of coherent acoustic phonon modes with frequencies up to 500 GHz in ultra-thin free-standing silicon membranes. Using an ultrafast pump-probe technique of asynchronous optical sampling, we observe that the decay time of the first-order dilatational mode decreases significantly from \sim 4.7 ns to 5 ps with decreasing membrane thickness from \sim 194 to 8 nm. The experimental results are compared with theories considering both intrinsic phonon-phonon interactions and extrinsic surface roughness scattering including a wavelength-dependent specularity. Our results provide insight to understand some of the limits of nanomechanical resonators and thermal transport in nanostructures.Show less >
Show more >We study the relaxation of coherent acoustic phonon modes with frequencies up to 500 GHz in ultra-thin free-standing silicon membranes. Using an ultrafast pump-probe technique of asynchronous optical sampling, we observe that the decay time of the first-order dilatational mode decreases significantly from \sim 4.7 ns to 5 ps with decreasing membrane thickness from \sim 194 to 8 nm. The experimental results are compared with theories considering both intrinsic phonon-phonon interactions and extrinsic surface roughness scattering including a wavelength-dependent specularity. Our results provide insight to understand some of the limits of nanomechanical resonators and thermal transport in nanostructures.Show less >
Language :
Anglais
Popular science :
Non
Source :
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