Title :

THz media characterization by means of coherent homodyne detection, results and potential applications

Author(s) :

Mouret, Gaël [Auteur]
Laboratoire de Physico-Chimie de l'Atmosphère [LPCA]
Matton, S. [Auteur]
Laboratoire de Physico-Chimie de l'Atmosphère [LPCA]
Bocquet, Robin [Auteur]
Laboratoire de Physico-Chimie de l'Atmosphère [LPCA]
Bigourd, Damien [Auteur]
Laboratoire de Physico-Chimie de l'Atmosphère [LPCA]
Hindle, Francis [Auteur]
Laboratoire de Physico-Chimie de l'Atmosphère [LPCA]
Cuisset, A. [Auteur]
Laboratoire de Physico-Chimie de l'Atmosphère [LPCA]
Lampin, Jean-Francois [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Blary, Karine [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lippens, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Journal title :

Applied Physics B - Laser and Optics

Pages :

395-399

Publisher :

Springer Verlag

Publication date :

2007

ISSN :

0946-2171

English keyword(s) :

Delay Line
Path Difference
Homodyne Detection
Large Tunability
Spiral Antenna

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

This paper describes the performance of a coherent homodyne spectrometer to preserve phase information of the THz electric field. Thereby, optical constants of a high resistive silicon sample are presented between 200 GHz ...
Show more >This paper describes the performance of a coherent homodyne spectrometer to preserve phase information of the THz electric field. Thereby, optical constants of a high resistive silicon sample are presented between 200 GHz and 1.2 THz. The phase shift introduced by such a thick sample is much greater than 2π, and the manner of solving the ambiguity of the modulo 2π is discussed and can be used to surround the refractive index mainly at high frequency where the signal to noise ratio decreases. The analysis of the coherent homodyne signal as a function as the frequency at a fixed delay line permits deduction of sample thickness or measurement of distance without any mechanical displacement, and so facilitates potential ranging and tomography studies.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL