Electric force microscopy of individually ...
Document type :
Compte-rendu et recension critique d'ouvrage
DOI :
Title :
Electric force microscopy of individually charged semiconductor nanoparticles
Author(s) :
Diesinger, Heinrich [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Melin, Thierry [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Barbet, Sophie [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Deresmes, D. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Stiévenard, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Melin, Thierry [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Barbet, Sophie [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Deresmes, D. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Stiévenard, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
physica status solidi (a)
Pages :
1344-1347
Publisher :
Wiley
Publication date :
2006
ISSN :
0031-8965
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
Charge injection experiments by electrostatic force microscopy are performed on single semiconductor nanoparticles. Different methods of detecting the stored charge are used. Although the amount of charge stored in particles ...
Show more >Charge injection experiments by electrostatic force microscopy are performed on single semiconductor nanoparticles. Different methods of detecting the stored charge are used. Although the amount of charge stored in particles of realistic shape can be determined quantitatively, we present here a qualitative comparison between Q (V ) hysteresis curves observed on silicon and GaN quantum dots, in dry nitrogen and in ultra high vacuum. For silicon dots in dry atmosphere, we find a hysteresis behavior entirely different from the one observed on GaN dots in ultra high vacuum. The contribution of interface states to hysteresis is discussedShow less >
Show more >Charge injection experiments by electrostatic force microscopy are performed on single semiconductor nanoparticles. Different methods of detecting the stored charge are used. Although the amount of charge stored in particles of realistic shape can be determined quantitatively, we present here a qualitative comparison between Q (V ) hysteresis curves observed on silicon and GaN quantum dots, in dry nitrogen and in ultra high vacuum. For silicon dots in dry atmosphere, we find a hysteresis behavior entirely different from the one observed on GaN dots in ultra high vacuum. The contribution of interface states to hysteresis is discussedShow less >
Language :
Anglais
Popular science :
Non
Source :
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