Titre :

Joint modeling of received power, mean delay, and delay spread for wideband radio channels

Auteur(s) :

Bharti, Ayush [Auteur]
Aalborg University [Denmark] [AAU]
Adeogun, Ramoni [Auteur]
Aalborg University [Denmark] [AAU]
Cai, Xuesong [Auteur]
Aalborg University [Denmark] [AAU]
Fan, Wei [Auteur]
Aalborg University [Denmark] [AAU]
Briol, Francois-Xavier [Auteur]
University College of London [London] [UCL]
Clavier, Laurent [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Circuits Systèmes Applications des Micro-ondes - IEMN [CSAM - IEMN ]
Ecole nationale supérieure Mines-Télécom Lille Douai [IMT Lille Douai]
Pedersen, Troels [Auteur]
Aalborg University [Denmark] [AAU]

Titre de la revue :

IEEE Transactions on Antennas and Propagation

Pagination :

4871-4882

Éditeur :

Institute of Electrical and Electronics Engineers

Date de publication :

2021

ISSN :

0018-926X

Mot(s)-clé(s) en anglais :

Mean delay
millimeter-wave
multivariate lognormal
root mean square (rms) delay spread
temporal moments
wideband radio channels

Discipline(s) HAL :

Sciences de l'ingénieur [physics]/Traitement du signal et de l'image [eess.SP]

Résumé en anglais : [en]

We propose a multivariate log-normal distribution to jointly model received power, mean delay, and root mean square (rms) delay spread of wideband radio channels, referred to as the standardized temporal moments. The model ...
Lire la suite >We propose a multivariate log-normal distribution to jointly model received power, mean delay, and root mean square (rms) delay spread of wideband radio channels, referred to as the standardized temporal moments. The model is validated using experimental data collected from five different measurement campaigns (four indoor scenarios and one outdoor scenario). We observe that the received power, the mean delay, and the rms delay spread are correlated random variables, and therefore, should be simulated jointly. Joint models are able to capture the structure of the underlying process, unlike the independent models considered in the literature. The proposed model of the multivariate log-normal distribution is found to be a good fit for a large number of wideband data sets.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL