Titre :

Statistical Estimation of Fast Varying Channels for Cellular Mobile Telecommunications Systems

Auteur(s) :

Dayoub, Iyad [Auteur]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Zaizouni, M. [Auteur]
Rivenq, Atika [Auteur]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Rouvaen, Jean-Michel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Titre de la revue :

Wireless Personal Communications

Pagination :

527-536

Éditeur :

Springer Verlag

Date de publication :

2003-03

ISSN :

0929-6212

Mot(s)-clé(s) en anglais :

EDGE system
channel estimation
equalization
fast fading
impulse response

Discipline(s) HAL :

Informatique [cs]/Réseaux et télécommunications [cs.NI]

Résumé en anglais : [en]

The time variant environment in fast channels severely impacts on the performances of classical equal-ization techniques. A method is proposed here to circumvent this problem, particularly in the severe channel with fast ...
Lire la suite >The time variant environment in fast channels severely impacts on the performances of classical equal-ization techniques. A method is proposed here to circumvent this problem, particularly in the severe channel with fast behaviour. To improve the Bit Error Rate (BER) at the receiver, a new approach is proposed for the channel impulse response (CIR) estimation in the Enhanced Data rates for GSM Evolution (EDGE) cellular system. The computation of the CIR h(t) (finite impulse response filter) is performed by using the Least Squares algorithm. Then, a statistical estimation of the CIR is achieved to update the coefficients of the equalizer filter. Computer simulation results show that statistical estimation (CIR re-estimation) provides significant improvement with 250 km/h vehicle speed (RA250): the bit error rate (BER) is 20% lowered for data bits far from the middle of the burst.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL