Title :

Sensitivity analysis of residuals for soft fault monitoring in Y-shaped networks

Author(s) :

Abdelkarim, Abdelkarim [Auteur]
Télécommunication, Interférences et Compatibilité Electromagnétique - IEMN [TELICE - IEMN]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]
DEGARDIN, Virginie [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Télécommunication, Interférences et Compatibilité Electromagnétique - IEMN [TELICE - IEMN]
Cocquempot, Vincent [Auteur]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]

Conference title :

The 6th International Conference on Control, Automation and Diagnosis (ICCAD'22)

City :

Lisbon

Country :

Portugal

Start date of the conference :

2022-07-13

English keyword(s) :

Soft fault
Sensitivity analysis
Fault monitoring
Electrical cables
Power Line Communication

HAL domain(s) :

Sciences de l'ingénieur [physics]/Automatique / Robotique
Sciences de l'ingénieur [physics]/Electronique

English abstract : [en]

Networks, mainly composed of cables, are prone to failures. Faults in cables are initially benign (so-called soft faults) and then evolve over time to a much more severe form of faults as short or open circuits (so-called ...
Show more >Networks, mainly composed of cables, are prone to failures. Faults in cables are initially benign (so-called soft faults) and then evolve over time to a much more severe form of faults as short or open circuits (so-called hard faults). It is thus of prime importance to detect and localize efficiently the soft faults. Residuals may be calculated by comparing online computed transmission coefficients with reference transmission coefficients. In this paper, the sensitivity of the residuals with respect to the fault is studied for a simulated but realistic Yshaped network. The residuals are represented in the residual space. Using intensive simulations, the residuals are analyzed with respect to the position of the fault in a branch, the severity of the fault and the signal-to-noise ratio.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL