Titre :

Explainable root cause and pathway analysis with robust and adaptive statistics

Auteur(s) :

Atoui, Mohamed Amine [Auteur]
Télécommunication, Interférences et Compatibilité Electromagnétique - IEMN [TELICE - IEMN]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]
Cocquempot, Vincent [Auteur correspondant]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]

Titre de la revue :

Computers in Industry

Pagination :

103770

Éditeur :

Elsevier

Date de publication :

2023-01

ISSN :

0166-3615

Mot(s)-clé(s) en anglais :

Process monitoring
Root cause identification
Bayesian belief network

Discipline(s) HAL :

Sciences de l'ingénieur [physics]
Informatique [cs]/Automatique
Sciences de l'ingénieur [physics]/Automatique / Robotique
Statistiques [stat]/Applications [stat.AP]

Résumé en anglais : [en]

Accurate detection of faults is desired to reduce risks and costs. The identification of the propagation path of faults and the system’s variables responsible of faulty operating conditions is also paramount. This paper ...
Lire la suite >Accurate detection of faults is desired to reduce risks and costs. The identification of the propagation path of faults and the system’s variables responsible of faulty operating conditions is also paramount. This paper presents a new alternative to a well-known Bayesian network-based approach to detect and identify root causes in multivariate processes. It deals with the complexity generated by the use of Bayesian network in terms of structure and decision making. The new strategy is straightforward and based on statistical foundations. The new approach revives the interest of Mason, Young and Tracy (MYT) decomposition of quadratic statistics and alleviates considerably the complexity of their upgrades. Comparison with previous approaches and performance evaluation using the Tennessee Eastman process demonstrate the feasibility and interest of the new proposal.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL