Fabrication of silicon nitride membrane ...
Type de document :
Compte-rendu et recension critique d'ouvrage
Titre :
Fabrication of silicon nitride membrane nanoelectromechanical resonator
Auteur(s) :
Xu, Hao [Auteur]
Physique - IEMN [PHYSIQUE - IEMN]
Venkatachalam, Srisaran [Auteur]
Physique - IEMN [PHYSIQUE - IEMN]
Boyaval, Christophe [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Tilmant, Pascal [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Vaurette, Francois [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Deblock, Yves [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Théron, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Nano and Microsystems - IEMN [NAM6 - IEMN]
Zhou, Xin [Auteur]
Physique - IEMN [PHYSIQUE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Physique - IEMN [PHYSIQUE - IEMN]
Venkatachalam, Srisaran [Auteur]
Physique - IEMN [PHYSIQUE - IEMN]
Boyaval, Christophe [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Tilmant, Pascal [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Vaurette, Francois [Auteur]
![refId](/themes/Mirage2//images/idref.png)
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Deblock, Yves [Auteur]
![refId](/themes/Mirage2//images/idref.png)
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Théron, Didier [Auteur]
![refId](/themes/Mirage2//images/idref.png)
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Nano and Microsystems - IEMN [NAM6 - IEMN]
Zhou, Xin [Auteur]
![refId](/themes/Mirage2//images/idref.png)
Physique - IEMN [PHYSIQUE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Titre de la revue :
MICROELECTRONIC ENGINEERING
Pagination :
112064
Éditeur :
Elsevier
Date de publication :
2023
ISSN :
0167-9317
Mot(s)-clé(s) en anglais :
parametric amplification
Silicon nitride membrane
nanofabrication
nanoelectromechanical resonator
Silicon nitride membrane
nanofabrication
nanoelectromechanical resonator
Discipline(s) HAL :
Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique
Résumé en anglais : [en]
In this work, we present details of the nanofabrication process for achieving a silicon nitride nanoelectromechanical resonator, consisting of a membrane covered with a thin aluminium layer capacitively coupled to a suspended ...
Lire la suite >In this work, we present details of the nanofabrication process for achieving a silicon nitride nanoelectromechanical resonator, consisting of a membrane covered with a thin aluminium layer capacitively coupled to a suspended top gate. Critical nanofabrication steps have been discussed, including the XeF2 selective etching process to release the silicon nitride membrane from the substrate and the reflow process to fabricate a top gate of a suspended membrane. This ultra-clean and CMOS-compatible process allows the silicon nitride membrane to have a high quality factor (∼1.1×10 4) at room temperature and offers access to electrical integration with external circuits with high efficiency. In addition, we also demonstrate parametric amplification and de-amplification of the input signals by exploiting this suspended top gate. The measurement results of phase-sensitive amplifications have also been well fit by analytical caculations. The present work provides essential building blocks for further exploration of silicon nitride membrane based nanoelectromechanical resonators that can be efficiently integrated into large-scale electrical circuits.Lire moins >
Lire la suite >In this work, we present details of the nanofabrication process for achieving a silicon nitride nanoelectromechanical resonator, consisting of a membrane covered with a thin aluminium layer capacitively coupled to a suspended top gate. Critical nanofabrication steps have been discussed, including the XeF2 selective etching process to release the silicon nitride membrane from the substrate and the reflow process to fabricate a top gate of a suspended membrane. This ultra-clean and CMOS-compatible process allows the silicon nitride membrane to have a high quality factor (∼1.1×10 4) at room temperature and offers access to electrical integration with external circuits with high efficiency. In addition, we also demonstrate parametric amplification and de-amplification of the input signals by exploiting this suspended top gate. The measurement results of phase-sensitive amplifications have also been well fit by analytical caculations. The present work provides essential building blocks for further exploration of silicon nitride membrane based nanoelectromechanical resonators that can be efficiently integrated into large-scale electrical circuits.Lire moins >
Langue :
Anglais
Vulgarisation :
Non
Projet ANR :
Source :
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