Title :

Experimental investigation and modeling attempt on the effects of ultraviolet aging on the fatigue behavior of an LDPE semi-crystalline polymer

Author(s) :

Lamnii, Hamza [Auteur]
Unité de Mécanique de Lille - ULR 7512 [UML]
Université de Lille
Nait-Abelaziz, Moussa [Auteur]
Unité de Mécanique de Lille - ULR 7512 [UML]
Université de Lille
Ayoub, Georges [Auteur]
Texas A&M University at Qatar
Colin, Xavier [Auteur]
Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
Maschke, Ulrich [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Université de Lille

Journal title :

International Journal of Fatigue

Pages :

1-12

Publisher :

Elsevier

Publication date :

2021-01

ISSN :

0142-1123

English keyword(s) :

Mechanical Engineering
Modelling and Simulation
Industrial and Manufacturing Engineering
General Materials Science
Mechanics of Materials

HAL domain(s) :

Sciences de l'ingénieur [physics]/Matériaux

English abstract : [en]

The objective of this study was to investigate the effect of UV irradiation on the fatigue life of a bulk semi-crystalline polymer. Low-density polyethylene samples exposed to different UV irradiation doses were fatigue ...
Show more >The objective of this study was to investigate the effect of UV irradiation on the fatigue life of a bulk semi-crystalline polymer. Low-density polyethylene samples exposed to different UV irradiation doses were fatigue tested. Fatigue indicator based on dissipated energy per cycle was found to present the best correlation with the experimental fatigue results. A master curve unifying the experimental fatigue results for as-received and UV-aged materials was obtained when subtracting the dissipated energy threshold from the total dissipated energy. Finally, the evolution of the damage with cyclic loading was analyzed and preliminary modeling was attempted.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Unité de Mécanique de Lille (UML) - ULR 7512

Source :

Harvested from HAL