Titre :

Characterisation of the Adhesion Phenomenon by Rayleigh Wave Generated and Detected by Laser Ultrasonics.

Auteur(s) :

Baher, Mustapha [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Transduction, Propagation et Imagerie Acoustique - IEMN [TPIA - IEMN]
Université Polytechnique Hauts-de-France [UPHF]
Chrifi Alaoui, Meriem [Auteur]
Transduction, Propagation et Imagerie Acoustique - IEMN [TPIA - IEMN]
Université Polytechnique Hauts-de-France [UPHF]
Jenot, Frederic [Auteur]
Transduction, Propagation et Imagerie Acoustique - IEMN [TPIA - IEMN]
Université Polytechnique Hauts-de-France [UPHF]
Ouaftouch, Mohammadi [Auteur]
Transduction, Propagation et Imagerie Acoustique - IEMN [TPIA - IEMN]
Université Polytechnique Hauts-de-France [UPHF]
Duquennoy, Marc [Auteur]
Transduction, Propagation et Imagerie Acoustique - IEMN [TPIA - IEMN]
Université Polytechnique Hauts-de-France [UPHF]

Titre de la manifestation scientifique :

Mardi des Chercheurs

Ville :

Mons

Pays :

Belgique

Date de début de la manifestation scientifique :

2022-09-06

Discipline(s) HAL :

Sciences de l'ingénieur [physics]/Acoustique [physics.class-ph]

Résumé en anglais : [en]

Non-destructive and non-contact characterization of adhesion by surface acoustic waves (SAW) is an important goal for thin film coating. In this work, SAW are generated by a Nd: YAG laser on an aluminum sample covered by ...
Lire la suite >Non-destructive and non-contact characterization of adhesion by surface acoustic waves (SAW) is an important goal for thin film coating. In this work, SAW are generated by a Nd: YAG laser on an aluminum sample covered by a PVC film of a uniform thickness. The normal displacement is detected at aluminum surface by an interferometer. The influence of the adhesion levels is observed on acoustic signals and a model using finite element method compares theoretical and experimental results. A Matlab code is also developed to plot the dispersion curves according to the transfer-matrix method. It allows to characterize quality of adhesion.Lire moins >

Langue :

Anglais

Comité de lecture :

Oui

Audience :

Internationale

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL