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The effect of LaNiO3 bottom electrode thickness on ferroelectric and dielectric properties of (100) oriented PbZr0.53Ti0.47O3 films
Journal of Crystal Growth, Elsevier, 2005, 284; 1-2, 184-189Compte-rendu et recension critique d'ouvragefulltext -
Orientation control of LaNiO3 thin films by RF magnetron sputtering with different oxygen partial pressure
Journal of Crystal Growth, Elsevier, 2009, 311, 4241-4246Compte-rendu et recension critique d'ouvragefulltext -
On the influence of the top and bottom electrodes - A comparative study between Pt and LNO electrodes for PZT thin films
Journal of Crystal Growth, Elsevier, 2008, 310, 3299-3302Compte-rendu et recension critique d'ouvragefulltext -
Combined annealing temperature and thickness effects on properties of PbZr0.53Ti0.47O3 films on LaNiO3/Si substrate by sol-gel process
Journal of Crystal Growth, Elsevier, 2006, 293, 370-375Compte-rendu et recension critique d'ouvrage