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Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy
Applied Physics Letters, American Institute of Physics, 2005, 86, 213114Article dans une revue scientifique -
Terahertz radiation from heavy-ion irradiated In0.35Ga0.47As photoconductive antenna at 1.55 µm
Applied Physics Letters, American Institute of Physics, 2005, 87; 193510, 279-280Article dans une revue scientifique -
Formation of silicon islands on a silicon on insulator substrate upon thermal annealing
Applied Physics Letters, American Institute of Physics, 2000, 76, 3271-3273Article dans une revue scientifique -
Why do (2x4) GaAs and InAs (001) surfaces exposed to phosphorus have so different strain behavior ?
Applied Physics Letters, American Institute of Physics, 2002, 81, 1086-1088Article dans une revue scientifique -
Two Young modulus of Pb(Zr,Ti)03 thin films measured by nanoindentation
Applied Physics Letters, American Institute of Physics, 2004, 85(22), pp. 1-3Compte-rendu et recension critique d'ouvrage -
Generation and detection of terahertz pulses using post-process bonding of low-temperature-grown GaAs and AlGaAs
Applied Physics Letters, American Institute of Physics, 2004, 84, 2049-2051Compte-rendu et recension critique d'ouvrage -
Two-photon absorption in InP substrates in the 1.55 µm range
Applied Physics Letters, American Institute of Physics, 2004, 85, 239Compte-rendu et recension critique d'ouvrage -
Detection of picosecond electrical pulses using the intrinsic Franz-Keldysh effect
Applied Physics Letters, American Institute of Physics, 2001, 78; 26, 4103-4105Compte-rendu et recension critique d'ouvrage -
Why do (2x4) GaAs and InAs (001) surfaces exposed to phosphorus have so different strain behavior ?
Applied Physics Letters, American Institute of Physics, 2002, 81, 1060-1062Compte-rendu et recension critique d'ouvrage -
Shock wave coupling between terahertz transmission lines on GaAs
Applied Physics Letters, American Institute of Physics, 2003, 83, 2483-2485Compte-rendu et recension critique d'ouvrage