Recherche
Résultats 1-10 de 988
-
Energy efficiency analysis of a TR-UWB system
Journal of Computer Science, Science Publications, 2016, 12; 1, 19-30Compte-rendu et recension critique d'ouvrage -
Evaluating Experimental Measurements of the IEEE 802.11p Communication Using ARADA LocoMate OBU Device Compared to the Theoretical Simulation Results
Wireless Personal Communications, Springer Verlag, 12-2017, 97; 3, 3861-3874Compte-rendu et recension critique d'ouvrage -
Laser-ultrasound-based non-destructive testingOptimization of the thermoelastic source
Measurement Science and Technology, IOP Publishing, 08-2015, 26; 8, 5 p.Compte-rendu et recension critique d'ouvrage -
Stochastic model for action potential simulation including ion shot noise
Journal of Computational Electronics, Springer Verlag, 06-2017, 16; 2, 419-430Compte-rendu et recension critique d'ouvrage -
A biocompatible and flexible polyimide for wireless sensors
Microsystem Technologies, Springer Verlag, 12-2017, 23; 12, 5921-5929Compte-rendu et recension critique d'ouvrage -
Dielectric Characterization of Polylactic Acid Substrate in the Frequency Band 0.5-67 GHz
IEEE Microwave and Wireless Components Letters, Institute of Electrical and Electronics Engineers, 2018, 28; 5, 374-376Compte-rendu et recension critique d'ouvrage -
Transmission gaps, trapped modes and Fano resonances in Aharonov-Bohm connected mesoscopic loops
Physics Letters A, Elsevier, 2018, 382; 9, 613-620Compte-rendu et recension critique d'ouvrage -
Thin-film adhesion characterization by Colored Picosecond Acoustics
Surface and Coatings Technology, Elsevier, 2018, 352, 406-410Compte-rendu et recension critique d'ouvrage -
Colloidal nanocrystals as LEGO® bricks for building electronic band structure models
Physical Chemistry Chemical Physics, Royal Society of Chemistry, 2018, 20; 12, 8177-8184Compte-rendu et recension critique d'ouvrage -
Annealing and biasing effects on the structural and optical properties of PECVD-grown TiO2 films from TTIP/O2 plasma
Journal of Materials Science: Materials in Electronics, Springer Verlag, 11-06-2018, 29; 15, 13254-13264Compte-rendu et recension critique d'ouvrage