A method to determine wide bandgap power ...
Document type :
Communication dans un congrès avec actes
Title :
A method to determine wide bandgap power devices packaging interconnections
Author(s) :
Pace, Loris [Auteur correspondant]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Defrance, Nicolas [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
De Jaeger, Jean-Claude [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Videt, Arnaud [Auteur]
Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
Idir, Nadir [Auteur]
Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Defrance, Nicolas [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
De Jaeger, Jean-Claude [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Videt, Arnaud [Auteur]
Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
Idir, Nadir [Auteur]
Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
Conference title :
23rd IEEE Workshop on Signal and Power Integrity (SPI)
City :
Chambery
Country :
France
Start date of the conference :
2019-06-18
Book title :
23rd IEEE Workshop on Signal and Power Integrity (SPI)
Journal title :
Proceedings of 23rd IEEE Workshop on Signal and Power Integrity, SPI 2019
Publisher :
IEEE
Publication date :
2019
English keyword(s) :
S-parameters
Packaging interconnections
access parasitics
GaN transistor
SiC diode
Packaging interconnections
access parasitics
GaN transistor
SiC diode
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
Wide Bandgap (WBG) power devices show very good characteristics for high frequency operation in power converters, leading to a better power integration by reducing size and weight of passive components. Access parasitics ...
Show more >Wide Bandgap (WBG) power devices show very good characteristics for high frequency operation in power converters, leading to a better power integration by reducing size and weight of passive components. Access parasitics such as resistances and inductances related to packaging and interconnections are important parameters to determine in order to better predict high frequency switching of WBG power devices. In order to design a 1 MHz hybrid GaN/SiC power converter, this paper reports on the characterization of packaged power devices such as Gallium Nitride (GaN) transistors and Silicon Carbide (SiC) Schottky diodes using S-parameters in order to extract the device parasitics. The method lays on a calibration procedure carried out using specific test fixtures designed on FR4 Printed Circuit Board (PCB). The proposed method has the objective to be suitable for a wide range of power devices.Show less >
Show more >Wide Bandgap (WBG) power devices show very good characteristics for high frequency operation in power converters, leading to a better power integration by reducing size and weight of passive components. Access parasitics such as resistances and inductances related to packaging and interconnections are important parameters to determine in order to better predict high frequency switching of WBG power devices. In order to design a 1 MHz hybrid GaN/SiC power converter, this paper reports on the characterization of packaged power devices such as Gallium Nitride (GaN) transistors and Silicon Carbide (SiC) Schottky diodes using S-parameters in order to extract the device parasitics. The method lays on a calibration procedure carried out using specific test fixtures designed on FR4 Printed Circuit Board (PCB). The proposed method has the objective to be suitable for a wide range of power devices.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Source :