Titre :

Broadband microwave interferometry for non destructive evaluation

Auteur(s) :

Haddadi, Kamel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lasri, Tuami [Auteur]
Microtechnology and Instrumentation for Thermal and Electromagnetic Characterization - IEMN [MITEC - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Titre de la manifestation scientifique :

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII

Ville :

Le Mans

Pays :

France

Date de début de la manifestation scientifique :

2013

Titre de l’ouvrage :

Proceedings of 13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII

Date de publication :

2013

Mot(s)-clé(s) en anglais :

near-field microwave microscopy
evanescent probe
interferometry
nondestructive testing

Discipline(s) HAL :

Sciences de l'ingénieur [physics]

Résumé en anglais : [en]

A broadband microwave interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, a hybrid coupler, an evanescent microwave ...
Lire la suite >A broadband microwave interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, a hybrid coupler, an evanescent microwave coaxial probe and a precise impedance tuner built up with a high precision programmable delay line and a variable motor-driven attenuator. Advantages such as simplicity of operation, broad frequency band capabilities and high measurement sensitivity are achieved. In particular, the measurement sensitivity, the depth and lateral resolutions of the microwave microscope are experimentally verified to evaluate the performances of the system. The usefulness and versatility of the method make it also suited for a wide range of applications.Lire moins >

Langue :

Anglais

Comité de lecture :

Oui

Audience :

Non spécifiée

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL