Titre :

Interferometer-based microwave microscopy operating in transmission mode

Auteur(s) :

Haddadi, Kamel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lasri, Tuami [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Titre de la revue :

IEEE Sensors Journal

Pagination :

2226-2227

Éditeur :

Institute of Electrical and Electronics Engineers

Date de publication :

2014

ISSN :

1530-437X

Mot(s)-clé(s) en anglais :

near-field microwave microscopy
evanescent probe
high impedance
interferometry
local characterization

Résumé en anglais : [en]

A microwave near-field sensing technique with sub-wavelength resolution is proposed for nondestructive local characterization of materials. The method is based on the measurement of a transmission coefficient by means of ...
Lire la suite >A microwave near-field sensing technique with sub-wavelength resolution is proposed for nondestructive local characterization of materials. The method is based on the measurement of a transmission coefficient by means of an association of a vector network analyzer, a hybrid coupler, an evanescent microwave coaxial probe, and an impedance tuner built up with a high precision programmable delay line and a variable motor-driven attenuator. Simplicity of operation and tuning possibility of the measurement sensitivity in the presence of the material under investigation are competitive advantages of the method. The depth and lateral resolutions of the microscope are experimentally verified.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL