Title :

A low complexity suboptimal MIMO receiver : the combined ZF-MLD algorithm

Author(s) :

Pammer, V. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Delignon, Yves [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Sawaya, Wadih [Auteur]
Ecole nationale supérieure Mines-Télécom Lille Douai [IMT Nord Europe]
Centre for Digital Systems [CERI SN - IMT Nord Europe]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Boulinguez, David [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Conference title :

4th IEEE Proceedings on Personal, Indoor and Mobile Radio Communications, PIMRC 2003.

City :

Beijing

Country :

Chine

Start date of the conference :

2003-09-07

Publisher :

IEEE, Piscataway, NJ, USA

Publication date :

2003

English keyword(s) :

MIMO
Fading
Statistical analysis
Bit error rate
Antenna arrays
Bluetooth
Transmitting antennas
Erbium
Additive white noise
Colored noise

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

Recently, wireless technologies have known an increasing success, thus becoming an interesting field for study. One of the topics of research are multiple antenna arrays. Signal recovery in that case is not obvious. Different ...
Show more >Recently, wireless technologies have known an increasing success, thus becoming an interesting field for study. One of the topics of research are multiple antenna arrays. Signal recovery in that case is not obvious. Different methods with different performances have been suggested. From a statistical analysis of errors at the output of zero-forcing, we have constructed a method, which we present in this article, that combines zero-forcing and maximum likelihood. We will demonstrate that it provides both a low complexity and nearly optimal results regarding binary error rate (BER). Furthermore, we will show its relevancy compared to the VBLAST algorithm.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL