Acoustic microscopy measurement of elastic ...
Type de document :
Compte-rendu et recension critique d'ouvrage
Titre :
Acoustic microscopy measurement of elastic constants by using an optimization method on measured and calculated SAW velocities : effect of initial Cij values on the calculation convergence and influence of the LFI transducer parameters on the determination of the SAW velocity
Auteur(s) :
Lematre, Michael [Auteur]
École des Mines de Douai [Mines Douai EMD]
Benmehrez, Youssef [Auteur]
École des Mines de Douai [Mines Douai EMD]
Bourse, G. [Auteur]
École des Mines de Douai [Mines Douai EMD]
Xu, Wei Jiang [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Ourak, Mohamed [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
École des Mines de Douai [Mines Douai EMD]
Benmehrez, Youssef [Auteur]
École des Mines de Douai [Mines Douai EMD]
Bourse, G. [Auteur]
École des Mines de Douai [Mines Douai EMD]
Xu, Wei Jiang [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Ourak, Mohamed [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Titre de la revue :
NDT & E International
Pagination :
279-286
Éditeur :
Elsevier
Date de publication :
2002
ISSN :
0963-8695
Mot(s)-clé(s) en anglais :
Line-focus acoustic microscopy
Anisotropic solids
Surface acoustic wave velocity
Elastic constants
Simplex method
Anisotropic solids
Surface acoustic wave velocity
Elastic constants
Simplex method
Discipline(s) HAL :
Sciences de l'ingénieur [physics]
Résumé en anglais : [en]
The determination of elastic constants in anisotropic solids by line-focus acoustic microscopy (LFAM) is discussed. The velocity of leaky surface acoustic waves (SAWs) has been obtained for different directions of propagation ...
Lire la suite >The determination of elastic constants in anisotropic solids by line-focus acoustic microscopy (LFAM) is discussed. The velocity of leaky surface acoustic waves (SAWs) has been obtained for different directions of propagation (φ) from the V(z) curves. The elastic constants are determined from the comparison of measured and calculated velocities. The principle is based on the minimization of the summation of the square difference ∑|VΦc−VΦm|2, by using a Simplex method. This paper deals with the case of cubic-crystallite solids defined by three independent elastic constants. The influence of the initial values of cij on the final result is discussed in the case of MgO substrate and TiN deposited on MgO substrate. Experimental SAW velocity profile is measured on (100) silicon substrate as a function of φ between [100] and [010] directions. The influence of the transducer parameters and defocusing distance are also discussed.Lire moins >
Lire la suite >The determination of elastic constants in anisotropic solids by line-focus acoustic microscopy (LFAM) is discussed. The velocity of leaky surface acoustic waves (SAWs) has been obtained for different directions of propagation (φ) from the V(z) curves. The elastic constants are determined from the comparison of measured and calculated velocities. The principle is based on the minimization of the summation of the square difference ∑|VΦc−VΦm|2, by using a Simplex method. This paper deals with the case of cubic-crystallite solids defined by three independent elastic constants. The influence of the initial values of cij on the final result is discussed in the case of MgO substrate and TiN deposited on MgO substrate. Experimental SAW velocity profile is measured on (100) silicon substrate as a function of φ between [100] and [010] directions. The influence of the transducer parameters and defocusing distance are also discussed.Lire moins >
Langue :
Anglais
Vulgarisation :
Non
Source :
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