The Fine-Structure Constant as a Ruler for ...
Type de document :
Article dans une revue scientifique: Article original
Titre :
The Fine-Structure Constant as a Ruler for the Band-Edge Light Absorption Strength of Bulk and Quantum-Confined Semiconductors
Auteur(s) :
Prins, P [Auteur]
Debye Institute for Nanomaterials Science
Alimoradi Jazi, Maryam [Auteur]
Universiteit Utrecht / Utrecht University [Utrecht]
Killilea, Niall [Auteur]
Friedrich-Alexander Universität Erlangen-Nürnberg = University of Erlangen-Nuremberg [FAU]
Evers, Wiel [Auteur]
Delft University of Technology [TU Delft]
Geiregat, Pieter [Auteur]
Universiteit Gent = Ghent University = Université de Gand [UGENT]
Heiss, Wolfgang [Auteur]
Friedrich-Alexander Universität Erlangen-Nürnberg = University of Erlangen-Nuremberg [FAU]
Houtepen, Arjan [Auteur]
Delft University of Technology [TU Delft]
Delerue, Christophe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Physique - IEMN [PHYSIQUE - IEMN]
Hens, Zeger [Auteur]
Universiteit Gent = Ghent University = Université de Gand [UGENT]
Vanmaekelbergh, Daniel [Auteur correspondant]
Debye Institute for Nanomaterials Science
Debye Institute for Nanomaterials Science
Alimoradi Jazi, Maryam [Auteur]
Universiteit Utrecht / Utrecht University [Utrecht]
Killilea, Niall [Auteur]
Friedrich-Alexander Universität Erlangen-Nürnberg = University of Erlangen-Nuremberg [FAU]
Evers, Wiel [Auteur]
Delft University of Technology [TU Delft]
Geiregat, Pieter [Auteur]
Universiteit Gent = Ghent University = Université de Gand [UGENT]
Heiss, Wolfgang [Auteur]
Friedrich-Alexander Universität Erlangen-Nürnberg = University of Erlangen-Nuremberg [FAU]
Houtepen, Arjan [Auteur]
Delft University of Technology [TU Delft]
Delerue, Christophe [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Physique - IEMN [PHYSIQUE - IEMN]
Hens, Zeger [Auteur]
Universiteit Gent = Ghent University = Université de Gand [UGENT]
Vanmaekelbergh, Daniel [Auteur correspondant]
Debye Institute for Nanomaterials Science
Titre de la revue :
Nano Letters
Pagination :
9426–9432
Éditeur :
American Chemical Society
Date de publication :
2021-11-24
ISSN :
1530-6984
Mot(s)-clé(s) en anglais :
fine-structure constant
optical transitions
light absorption
dielectric screening
quantum coupling
optical transitions
light absorption
dielectric screening
quantum coupling
Discipline(s) HAL :
Physique [physics]/Matière Condensée [cond-mat]
Résumé en anglais : [en]
Low-dimensional semiconductors have found numerous applications in optoelectronics. However, a quantitative comparison of the absorption strength of lowdimensional versus bulk semiconductors has remained elusive. Here, we ...
Lire la suite >Low-dimensional semiconductors have found numerous applications in optoelectronics. However, a quantitative comparison of the absorption strength of lowdimensional versus bulk semiconductors has remained elusive. Here, we report generality in the band-edge light absorptance of semiconductors, independent of their dimensions. First, we provide atomistic tight-binding calculations that show that the absorptance of semiconductor quantum wells equals mπα (m = 1 or 2 with α as the fine-structure constant), in agreement with reported experimental results. Then, we show experimentally that a monolayer (superlattice) of quantum dots has similar absorptance, suggesting an absorptance quantum of mπα per (confined) exciton diameter. Extending this idea to bulk semiconductors, we experimentally demonstrate that an absorptance quantum equal to mπα per exciton Bohr diameter explains their widely varying absorption coefficients. We thus provided compelling evidence that the absorptance quantum πα per exciton diameter rules the band-edge absorption of all direct semiconductors, regardless of their dimension.Lire moins >
Lire la suite >Low-dimensional semiconductors have found numerous applications in optoelectronics. However, a quantitative comparison of the absorption strength of lowdimensional versus bulk semiconductors has remained elusive. Here, we report generality in the band-edge light absorptance of semiconductors, independent of their dimensions. First, we provide atomistic tight-binding calculations that show that the absorptance of semiconductor quantum wells equals mπα (m = 1 or 2 with α as the fine-structure constant), in agreement with reported experimental results. Then, we show experimentally that a monolayer (superlattice) of quantum dots has similar absorptance, suggesting an absorptance quantum of mπα per (confined) exciton diameter. Extending this idea to bulk semiconductors, we experimentally demonstrate that an absorptance quantum equal to mπα per exciton Bohr diameter explains their widely varying absorption coefficients. We thus provided compelling evidence that the absorptance quantum πα per exciton diameter rules the band-edge absorption of all direct semiconductors, regardless of their dimension.Lire moins >
Langue :
Anglais
Comité de lecture :
Oui
Audience :
Internationale
Vulgarisation :
Non
Projet Européen :
Source :
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