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Modified AFM-tip for Infrared and THz near ...
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Document type :
Communication dans un congrès avec actes
DOI :
10.1109/IRMMW-THz.2019.8873908
Title :
Modified AFM-tip for Infrared and THz near field microscopy
Author(s) :
Akalin, Tahsin [Auteur] refId
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Conference title :
2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
City :
Paris
Country :
France
Start date of the conference :
2019-09-01
Publisher :
IEEE
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
Near field microscopy is commonly achieved thanks to the exaltation of the field between a tip and the sample. The free space electromagnetic wave at infrared or THz frequencies is focused in this extremely small area ...
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Near field microscopy is commonly achieved thanks to the exaltation of the field between a tip and the sample. The free space electromagnetic wave at infrared or THz frequencies is focused in this extremely small area compared to the wavelength. In many cases, the probe is a classical AFM-tip which was not designed and fabricated for this purpose. We present here an original approach in order to optimize the interaction between the impinging electromagnetic wave and the antenna-like probe. As a proof of concept we have modified with FIB (Focused Ion Beam) technique a commercial AFM-tip. The results in terms of resolution are very encouraging.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Collections :
  • Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Source :
Harvested from HAL
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