Influences of Metal Electrodes on Stability ...
Document type :
Article dans une revue scientifique: Article original
DOI :
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Title :
Influences of Metal Electrodes on Stability of Non‐Fullerene Acceptor‐Based Organic Photovoltaics
Author(s) :
Yoon, Sangcheol [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Schopp, Nora [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Choi, Dylan G. [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Wakidi, Hiba [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Ding, Kan [Auteur]
North Carolina State University [Raleigh] [NC State]
Ade, Harald [Auteur]
North Carolina State University [Raleigh] [NC State]
Vezin, Herve [Auteur]
Laboratoire Avancé de Spectroscopie pour les Intéractions la Réactivité et l'Environnement - UMR 8516 [LASIRE]
Reddy, Manjunatha [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Nguyen, Thuc‐Quyen [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Schopp, Nora [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Choi, Dylan G. [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Wakidi, Hiba [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Ding, Kan [Auteur]
North Carolina State University [Raleigh] [NC State]
Ade, Harald [Auteur]
North Carolina State University [Raleigh] [NC State]
Vezin, Herve [Auteur]
Laboratoire Avancé de Spectroscopie pour les Intéractions la Réactivité et l'Environnement - UMR 8516 [LASIRE]
Reddy, Manjunatha [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Nguyen, Thuc‐Quyen [Auteur]
Chemistry and Biochemistry [Santa Barbara] [CCS-UCSB]
Journal title :
Advanced Functional Materials
Abbreviated title :
Adv Funct Materials
Pages :
2308618
Publisher :
Wiley
Publication date :
2023-11-05
ISSN :
1616-301X
English keyword(s) :
bulk-heterojunction morphology
electrodes
interfaces
organic photovoltaic device stability
Y6 degradation
electrodes
interfaces
organic photovoltaic device stability
Y6 degradation
HAL domain(s) :
Chimie/Chimie théorique et/ou physique
Chimie/Chimie inorganique
Chimie/Chimie inorganique
English abstract : [en]
Understanding chemical degradation at the interface between different layers in an organic photovoltaic device (OPV) is crucial to improving the long‐term stability of OPVs. Herein, molecular‐level insights are provided ...
Show more >Understanding chemical degradation at the interface between different layers in an organic photovoltaic device (OPV) is crucial to improving the long‐term stability of OPVs. Herein, molecular‐level insights are provided into the impact of different metal top electrodes on the interfacial morphology and stability of photoactive layers in PM6:Y6 bulk‐heterojunction (BHJ) OPVs. OPVs with an aluminum (Al) top electrode exhibit inferior stability compared to silver (Ag) electrode devices upon thermal annealing, whereby thermal stress induces the diffusion of both Al and Ag atoms to the PM6:Y6 BHJ layer. The diffused Al atoms cause surface recombination at the interface between the photoactive layer and an interlayer. Specifically, X‐ray photoelectron spectroscopy suggests the different local chemical environments of PM6 and Y6 moieties in PM6:Y6/Al‐contact devices. These results are corroborated by solid‐state nuclear magnetic resonance and electron paramagnetic resonance spectroscopy measurements, indicating the formation of ionic and organo‐metallic‐like species at the sub‐layers of the PM6:Y6 BHJ morphology, which are estimated to be less than 5 wt% of the PM6:Y6/Al blend. By comparison, the Ag atoms do not adversely affect PM6:Y6 BHJ morphology and the associated device physics. The investigation of reactive electrode‐BHJ interfaces by multiscale characterization techniques and device physics is expected to provide guidance to future interfacial engineering strategies to develop stable and efficient OPVs.Show less >
Show more >Understanding chemical degradation at the interface between different layers in an organic photovoltaic device (OPV) is crucial to improving the long‐term stability of OPVs. Herein, molecular‐level insights are provided into the impact of different metal top electrodes on the interfacial morphology and stability of photoactive layers in PM6:Y6 bulk‐heterojunction (BHJ) OPVs. OPVs with an aluminum (Al) top electrode exhibit inferior stability compared to silver (Ag) electrode devices upon thermal annealing, whereby thermal stress induces the diffusion of both Al and Ag atoms to the PM6:Y6 BHJ layer. The diffused Al atoms cause surface recombination at the interface between the photoactive layer and an interlayer. Specifically, X‐ray photoelectron spectroscopy suggests the different local chemical environments of PM6 and Y6 moieties in PM6:Y6/Al‐contact devices. These results are corroborated by solid‐state nuclear magnetic resonance and electron paramagnetic resonance spectroscopy measurements, indicating the formation of ionic and organo‐metallic‐like species at the sub‐layers of the PM6:Y6 BHJ morphology, which are estimated to be less than 5 wt% of the PM6:Y6/Al blend. By comparison, the Ag atoms do not adversely affect PM6:Y6 BHJ morphology and the associated device physics. The investigation of reactive electrode‐BHJ interfaces by multiscale characterization techniques and device physics is expected to provide guidance to future interfacial engineering strategies to develop stable and efficient OPVs.Show less >
Language :
Anglais
Audience :
Internationale
Popular science :
Non
European Project :
Other project(s) or funding source(s) :
National Science Foundation. Grant Numbers: DMR #1720256, IRG-2
Office of Naval Research. Grant Numbers: N00014-21-1-2181, N000142012155
Office of Naval Research. Grant Numbers: N00014-21-1-2181, N000142012155
Administrative institution(s) :
Université de Lille
CNRS
CNRS
Collections :
Research team(s) :
Propriétés magnéto structurales des matériaux (PMSM)
RMN et matériaux inorganiques (RM2I)
RMN et matériaux inorganiques (RM2I)
Submission date :
2023-11-20T14:34:10Z
2024-01-25T15:19:06Z
2024-01-25T15:19:06Z
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