Recherche
Résultats 31-40 de 87
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The effect of LaNiO3 bottom electrode thickness on ferroelectric and dielectric properties of (100) oriented PbZr0.53Ti0.47O3 films
Journal of Crystal Growth, Elsevier, 2005, 284; 1-2, 184-189Compte-rendu et recension critique d'ouvragetexte intégral -
Wafer-scale integration of piezoelectric actuation capabilities in nanoelectromechanical systems resonators
2013 Nanomechanical Sensing Workshop, Stanford, USA, 05-2013, 2013Autre communication scientifique (congrès sans actes - poster - séminaire...)Communication dans un congrès avec actestexte intégral -
Asymmetry of polarization reversal and current-voltage characteristics of Pt/PZT-Film/Pt:Ti/SiO2/Si-substrate structures
Smart Materials Research, Hindawi Publishing Corporation, 2011, 2011, 374915Compte-rendu et recension critique d'ouvragetexte intégral -
PZT films etched by focused Ga3+ ion beam : studies of ion damage and post annealing treatment effects
International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, PFM 2009, Aveiro, 2009 -
Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate : analysis by two-dimensional tangential finite element method
Journal of Applied Physics, American Institute of Physics, 2010, 107, 054112-1-5Compte-rendu et recension critique d'ouvragetexte intégral -
Study of nano-domains by piezoresponse force microscopy of relaxor PMN-PT thin films : influence of the annealing temperature, film thickness and composition
European Materials Research Society Spring Meeting, E-MRS Spring 2009, Symposium H : Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films II, Strasbourg, 2009 -
Piezoelectric-actuated, piezoresistive-sensed circular micromembranes for label-free biosensing applications
Applied Physics Letters, American Institute of Physics, 2010, 97, 093703-1-3Compte-rendu et recension critique d'ouvragetexte intégral -
Interface depolarization field as common denominator of fatigue and size effect in Pb(Zr0.54Ti0.46)O3 ferroelectric thin film capacitors
Journal of Applied Physics, American Institute of Physics, 2010, 107, 104102-1-9Compte-rendu et recension critique d'ouvragetexte intégral -
Lead-free bismuth aluminate (BiAlO3) thin films : structural and electrical properties
Joint 20th IEEE International Symposium on Applications of Ferroelectrics and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF-PFM-2011, Vancouver, 2011 -
Integrative technology-based approach of microelectromechanical systems (MEMS) for biosensing applications
34th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2012, San Diego, CA, 2012, Proceedings of 34th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2012, 2012Communication dans un congrès avec actes