Browsing by Author "Fraysse, J.P."
Now showing items 1-7 of 7
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A non uniform thermal de-embedding approach for cryogenic on-wafer high frequency noise measurements
Delcourt, S.; Dambrine, Gilles; BOURZGUI, Nour-Eddine; et al.2004, 2004 IEEE International Microwave Symposium Digest, MTT-S 2004, IEEE, Piscataway, NJ, USA, 2004Communication dans un congrès avec actes -
Flip-chip mounted, Ku band power amplifier compliant with space application
Vendier, O.; Fraysse, J.P.; Schaffauser, C.; et al.2002, 2002 IEEE MTT-S International Microwave Symposium Digest, IEEE, Piscataway, NJ, USA, 2002Communication dans un congrès avec actes -
Ka band power pHEMT technology for space power flip-chip assembly
Rogeaux, E.; Fraysse, J.P.; Schaffauser, C.; et al.2001, 2001 IEEE MTT-S International Microwave Symposium Digest, IEEE, Piscataway, NJ, USA, 2001Communication dans un congrès avec actes -
Noise and dynamic cryogenic performance of metamorphic transistors from 20 to 42 GHz
Delcourt, S.; Dambrine, Gilles; BOURZGUI, Nour-Eddine; et al.1st European Microwave Integrated Circuits Conference, EuMIC 2006, 2006, Proceedings of the 1st European Microwave Integrated Circuits Conference, EuMIC 2006, IEEE, Piscataway, NJ, USA, 2006Communication dans un congrès avec actes -
On-wafer high frequency noise power measurements under cryogenic conditions : a new de-embedding approach [HEMT example]
Delcourt, S.; Dambrine, Gilles; BOURZGUI, Nour-Eddine; et al.2004, Proceedings of the 34th European Microwave Conference, EuMC 2004, Horizon House Publications Ltd, London, UK, 2004Communication dans un congrès avec actes -
Power flip-chip assembly for space application using HBT in Ku band
Vendier, O.; George, S.; Fraysse, J.P.; et al.2000, Proceedings of the 22nd IEEE Gallium Arsenide Integrated Circuit Symposium, IEEE, Piscataway, NJ, USA, 2000Communication dans un congrès avec actes -
Thermal de-embedding procedure for cryogenic on-wafer high frequency noise measurement
Delcourt, S.; Dambrine, Gilles; BOURZGUI, Nour-Eddine; et al.2004, Proceedings of the SPIE - International Society for Optical Engineering, 5470, SPIE – The International Society for Optical Engineering, Bellingham, WA, USA, 2004Communication dans un congrès avec actes