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Résultats 61-70 de 87
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Artificial duplication of polarization fatigue in Pb(Zr0.54Ti0.46)O3 thin film capacitors
Thin Solid Films, Elsevier, 2013, 527, 327-333Compte-rendu et recension critique d'ouvragetexte intégral -
Electrode size effect under PFM characterization of PZT-film on silicon structures with micro- and nanometric top electrodes
Joint 20th IEEE International Symposium on Applications of Ferroelectrics and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF-PFM-2011, Vancouver, 2011, Proceedings of Joint 20th IEEE International Symposium on Applications of Ferroelectrics and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF-PFM-2011, 2011Communication dans un congrès avec actes -
Integrative technology-based approach of MEMS for biological applications
IEEE International Solid-State Circuits Conference, San Francisco, 2010, IEEE International Solid-State Circuits Conference, 2010Communication dans un congrès avec actes -
Synthesis and characterization of (Na0.5Bi0.5)TiO3 (NBT) thin films
European Materials Research Society Spring Meeting, E-MRS Spring 2009, Symposium G : Fundamentals and technology of multifunctional oxide thin films, Strasbourg, 2009 -
Etching characteristics and absence of electrical properties damage of PZT thin films etched before crystallization
MICROELECTRONIC ENGINEERING, Elsevier, 2008, 85, 670-674Compte-rendu et recension critique d'ouvragetexte intégral -
Integration and optimisation of PZT piezoelectric thin films in micro and nano dimensional structures
Micro and Nanosystems, Bentham Science Publishers, 2009, 1, 214-225Compte-rendu et recension critique d'ouvrage -
On the influence of the top and bottom electrodes - A comparative study between Pt and LNO electrodes for PZT thin films
Journal of Crystal Growth, Elsevier, 2008, 310, 3299-3302Compte-rendu et recension critique d'ouvragetexte intégral -
Reactive ion beam etching effects on maskless PZT properties
Integrated Ferroelectrics, Taylor & Francis, 2002, 48, 221-229Compte-rendu et recension critique d'ouvragetexte intégral -
Artificial duplication of the fatigue state in PZT thin film capacitors
International Symposium on Integrated Functionalities, ISIF 2010, San Juan, PR, 2010 -
Analysis of the degradation induced by focused ion Ga3+ beam for the realization of piezoelectric nanostructures
Journal of Applied Physics, American Institute of Physics, 2010, 108; 4, 0420084Compte-rendu et recension critique d'ouvragetexte intégral