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Mid-IR s-SNOM imaging of photo-induced refractive index variation in chalcogenide glass
2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris, 01-09-2019, 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), IEEE, 21-10-2019Communication dans un congrès avec actesfulltext -
Scanning microwave microscopy of vital mitochondria in respiration buffer
IEEE/MTT-S International Microwave Symposium, IMS 2018, Philadelphia, PA, 10-06-2018, Proceedings of 2018 IEEE MTT-S International Microwave Symposium, IMS 2018, IEEE/MTT-S International Microwave Symposium, IMS 2018, 2018Communication dans un congrès avec actesfulltext -
Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysis[Invited]
IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes, IMWS-AMP 2017, Pavia, 20-09-2017, Proceedings of 2017 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes, IMWS-AMP 2017, 2017Communication dans un congrès avec actes -
Measurement Accuracy and Repeatability in Near-Field Scanning Microwave Microscopy
IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, Pisa, 11-05-2015, 2015 -
Resolving the Controversial Existence of Silicene and Germanene Nanosheets Grown on Graphite
ACS Nano, American Chemical Society, 2018, 12; 5, 4754–4760Compte-rendu et recension critique d'ouvragefulltext -
On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors
IEEE Microwave and Wireless Components Letters, Institute of Electrical and Electronics Engineers, 09-2018, 28; 9, 831 - 833Compte-rendu et recension critique d'ouvragefulltext -
Composition modulation by twinning in InAsSb nanowires Composition modulation by twinning in InAsSb nanowires
Nanotechnology, Institute of Physics, 05-2019, 30; 32Compte-rendu et recension critique d'ouvrage -
Nanoscale carrier multiplication mapping in a Si diode
Nano Letters, American Chemical Society, 24-09-2014, 14; 10, pp 5636-5640Compte-rendu et recension critique d'ouvragefulltext -
Cross-talk artefacts in Kelvin probe force microscopy imaging : a comprehensive study
Journal of Applied Physics, American Institute of Physics, 2014, 115; 14, 144313Compte-rendu et recension critique d'ouvragefulltext -
High efficiency UTC photodiodes as photonic emitters for 300 GHz high spectral efficiency wireless communications
11th European Conference on Antennas and Propagation (EUCAP), Paris, 19-03-2017, 11th European Conference on Antennas and Propagation (EUCAP), IEEE, 2017Communication dans un congrès avec actes