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Towards broadband THz spectroscopy and analysis of sub-wavelength-size biological samples
2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris, 01-09-2019Communication dans un congrès avec actestexte intégral -
Millimeter-wave in situ tuner : an efficient solution to extract the noise parameters of SiGe HBTs in the whole 130-170 GHz range
IEEE Microwave and Wireless Components Letters, Institute of Electrical and Electronics Engineers, 2014, 24, 649-651Compte-rendu et recension critique d'ouvrage -
Scanning microwave near-field microscope based on the multiport technology
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2013, 62, 3189-3193Compte-rendu et recension critique d'ouvrage -
Integrated MEMS RF Probe for SEM Station—Pad Size and Parasitic Capacitance Reduction
IEEE Microwave and Wireless Components Letters, Institute of Electrical and Electronics Engineers, 10-2015, 25; 10, 693-695Compte-rendu et recension critique d'ouvrage -
Broadband terahertz light-matter interaction enhancement for precise spectroscopy of thin films and micro-samples
Photonics, MDPI, 09-2018, 5; 2, 11Compte-rendu et recension critique d'ouvragetexte intégral -
In situ silicon-integrated tuner for automated on-wafer mmW noise parameters extraction using multi-impedance method for transistor characterization
IEEE Transactions on Semiconductor Manufacturing, Institute of Electrical and Electronics Engineers, 2012, 25, 170-177Compte-rendu et recension critique d'ouvrage -
Control and automation for miniaturized microwave GSG nanoprobing
Machine Vision and Navigation, Springer International Publishing, 01-10-2020Partie d'ouvragetexte intégral -
Triangular nanoperforation and band engineering of InGaAs quantum wells: a lithographic route toward Dirac cones in III–V semiconductors
Nanotechnology, Institute of Physics, 12-04-2019, 30; 15, 155301Compte-rendu et recension critique d'ouvrage -
An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements
Review of Scientific Instruments, American Institute of Physics, 2013, 84; 12, 123705Compte-rendu et recension critique d'ouvragetexte intégral -
Band offsets at zincblende-wurtzite GaAs nanowire sidewall surfaces
Applied Physics Letters, American Institute of Physics, 2013, 103, 122104-1-4Compte-rendu et recension critique d'ouvragetexte intégral